Solutions to the Industry, research & development sector using Optics and electro-optics principles
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Our Products
Fused Quartz & Crucibles
Infrared Emitters / Heaters, UV Lamps
Imaging Ellipsometers, Brewster Angle Spectroscopy, Surface Acoustics wave & Surface Chemical Purity
Optical Components and Coatings
Laser Energy/Power meters, Laser beam profilers, Laser wavelength meters, Firewire cameras, Attenuators
IR Radiometers, Blackbody sources, IR Detector Test systems and IR Flare test Systems
Spectroradiometers (Scanning & Multichannel), Integrating spheres, LED test systems
OptiLayer Thin Film Software for Design, Characterization, Reverse Engineering & On-Line Support of manufacture of Optical coatings
Atomic Force and Scanning probe microscope

Fused Quartz & Crucibles from JNC Quartz / Jinzhou Zhong Yi Helios Quartz Ltd
  • for Lighting
  • for semiconductors
  • for fiber optics
  • for Chemical industry
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Infrared Emitters / Heaters, UV Lamps from Helios Italquartz srl, Italy
  • for Glass Industry - Automatic Tin side detector for float glass
  • for plastic industry
  • for other heating applications in chemical industry
  • IR/UV Irradiation and Ageing chambers
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Imaging Ellipsometers, Brewster Angle Spectroscopy, Surface Acoustics wave & Surface Chemical Purity from
Nanofilm Technologie gmbH, Germany
Imaging Ellipsometer
  • EP3 SW Imaging Ellipsometer
  • EP3 MW Imaging Ellipsometer
  • EP3 SE Imaging Spectroscopic Ellipsometer
  • SPEM = EP3 + AFM – Imaging Ellipsometer & Scanning Probe Microscopy
Surface Chemistry
  • EP3 BAM Brewster Angle Microscopy
  • MicroBAM Miniature Brewster Angle Microscopy
  • Flounder Surface Chemical Purification Apparatus
  • RefSPEC3 Reflection spectroscopy
Marker-free affinity measurements
  • S-sens® K5 Sensor systems for marker-free real-time analysis of molecular reactions
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Optical Components and Coatings from Laser Zentrum Hannover e.V, Germany
Coating Applications
Mirrors for high power laser systems
Optics for femtosecond laser systems
AR-coatings on diode lasers
Thin film polarisation and wavelengths couplers
Broad band anti reflection coatings
Coatings for the VUV spectral range

Instrument Development
VUV-Spectrophotometer (115 nm – 300 nm)
Total Scatter Measurement set up
Broad band optical monitoring systems for online controlling and documentation of deposition processes
White light interferometer for phase measurements
VUV Online Spectrophotometer
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Laser Energy/Power meters, Laser beam profilers, Laser wavelength meters, Firewire cameras, Attenuators from Metrolux GmbH
  • Laser Energy / Power meters with sensors
  • Laser beam profilers with firewire cameras and attenuators
  • Laser Wavelength meters
  • VUV spectrophotometers
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IR Radiometers, Blackbody sources, IR Detector Test systems and IR Flare test Systems from Infrared Systems Development Centre, USA
  • IR Blackbody sources
  • IR Radiometers
  • IR Flare Radiometers
  • IR Detector test systems
  • Collimators
  • Multichannel IR spectroscopy systems
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Spectroradiometers (Scanning & Multichannel), Integrating spheres, LED test systems, from Instrument Sytems GmbH
  • LED Analysis for manufacturers and incoming quality control for end users
  • Display Testing for the automotive, aerospace (military and commercial), and FPD market
  • Spectroradiometry and Photometry for the lighting industry and UV research
  • Transmission and Reflection for the optics industry and thin film coatings
  • Polarization Analysis for research, fiber sensors and testing of optical components
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OptiLayer Thin Film Software for Design, Characterization, Reverse Engineering & On-Line Support of manufacture of Optical coatings from OptiLayer Ltd. Moscow.
  • OptiLayer for design, evaluation and monitoring of optical thin film coatings
  • OptiChar for optical characterization of thin films based on spectral photometric and spectral ellipsometric data
  • OptiRE for post-production characterization and reverse engineering of optical coatings
  • OptiReOPt is set of special OptiLayer DLL functionsfor the on-line characterization and re-optimization of coatings in any production environment
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Atomic Force and Scanning probe microscope (AFM / SPM) from Surface Imaging Systems, Germany
  • ULTRAObjective: Retrofitting optical microscopes. The budgetary solution. Scan ranges 20 µm, 40 µm . Liquid version available
  • NANOStation 300: For industrial applications. Can handle wafers up to 300 mm diameter
  • PICOStation:High resolution Scan ranges 20 µm, 40 µm, 80 µm . Liquid version available
  • NANOStation: High resolution Scan + Zeiss microscope Scan ranges 20 µm, 40 µm, 80 µm, 200 µm. Liquid version available
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